Scanning Electron Microscope - JEOL JSM-6610LV

    Equipment/facility: Equipment

      Facility/Equipment Details

      Description

      hermionic emission

      Detectors: SEI in-lens and LABE Backscattered

      Magnification: 5X to 300,000X with resolution of 3.0 nm at 30kV

      Accelerating voltage: 0.3 kV - 30 kV

      Large view chamber- samples as large as 20 cm diameter x 80 mm height

      JEOL digital camera and No EDS

      Selectable High and Low vacuum modes

      The selectable Low Vacuum mode allows for observation of specimens that cannot be viewed at high vacuum due to excessive water content or because they have a non-conductive surface. Low Vac mode has lower resolution than High Vac mode.
      Scanning Electron Microscope - JEOL JSM-6610LV

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