Facility/Equipment Details
Description
Field Emission SEM
Detectors: SEI in-lens, LEI, LABE Backscattered, STEM in SEM
Energy Dispersive X-ray Spectrometer (EDS) using Oxford X-max Silicon Drift Detector
Magnification: 25x to 1,000,000X magnification
with resolution of 1.0 nm at 1kV, 0.8nm at 15kV, 0.6 nm at 30kV
Accelerating voltage: 0.1kV to 30kV
JEOL digital camera
Field Emission LaB6 crystal electron gun with High Brightness, Low Energy Spread, High Beam Stability
Gentle Beam mode for top-surface imaging, reduced beam damage and charge suppression.
A standard LABE detector for detecting very low energy and very low angle backscattered electrons.
STEM in SEM - Scanning Transmission Electron Microscopy in an SEM
Detectors: SEI in-lens, LEI, LABE Backscattered, STEM in SEM
Energy Dispersive X-ray Spectrometer (EDS) using Oxford X-max Silicon Drift Detector
Magnification: 25x to 1,000,000X magnification
with resolution of 1.0 nm at 1kV, 0.8nm at 15kV, 0.6 nm at 30kV
Accelerating voltage: 0.1kV to 30kV
JEOL digital camera
Field Emission LaB6 crystal electron gun with High Brightness, Low Energy Spread, High Beam Stability
Gentle Beam mode for top-surface imaging, reduced beam damage and charge suppression.
A standard LABE detector for detecting very low energy and very low angle backscattered electrons.
STEM in SEM - Scanning Transmission Electron Microscopy in an SEM
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Research output
- 1 Article
-
A solvent-reduction approach to tetrapod-like copper(I) chloride crystallites
Li, Q., Shao, M., Yu, G., Wu, J., Li, F. & Qian, Y., Feb 1 2003, In: Journal of Materials Chemistry. 13, 2, p. 424-427 4 p.Research output: Contribution to journal › Article › peer-review
18 Scopus citations