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X-Rays & Materials Characterization

    Center for Advanced Materials Science

    Equipment/facility: Equipment

      Facility/Equipment Details

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      Equipment hierarchy

      Advanced Materials Science Core Research Laboratory (AMCRL)
      X-Rays & Materials Characterization
      MALDI-TOF - Bruker microflex LRF
      Scanning Electron Microscope - JEOL JSM-7600F
      TG/DTA Simultaneous Measuring Instrument - Shimadzu DTG-60H
      X-ray Diffraction: Powder - PANalytical Empyrean Series 2
      X-ray Diffraction: Powder - Rigaku miniFlex 600
      X-ray Diffraction: Single Crystal - Rigaku Synergy-i XRD
      X-ray Diffraction: Single Crystal - Rigaku XtaLAB mini
      View all 7 facilities/equipment