@inproceedings{8630ea28fdbe447e84ca8a5bee13747e,
title = "A deterministic-chaos study of electron triboemission outputs",
abstract = "The authors have carried out extensive measurements of electron triboemission from the scratching of ceramics and semiconductors that are briefly summarized in this paper. Analysis of the frequency-domain distribution of typical triboemission count-pulse outputs suggested that their occurrence is not Poisson's (e.g., it is not random). This paper presents a study on the hypothesis of deterministic-chaos origin for triboemission data. Electron triboemission outputs from the ceramics alumina, sapphire, silicon nitride and the semiconductors Si and Ge are analyzed by means of extracting deterministic-chaos metrics. The results suggest that the low-level electron-emission components may be described by multiplicative processes of random initiation, while the superimposed large burst-type components may be of deterministic origin.",
author = "Molina, {G. J.} and Furey, {M. J.} and C. Kajdas",
year = "2006",
doi = "10.1115/ijtc2006-12005",
language = "English",
isbn = "0791837890",
series = "Proceedings of STLE/ASME International Joint Tribology Conference, IJTC 2006",
publisher = "American Society of Mechanical Engineers",
booktitle = "Proceedings of STLE/ASME International Joint Tribology Conference, IJTC 2006",
note = "STLE/ASME International Joint Tribology Conference, IJTC 2006 ; Conference date: 23-10-2006 Through 25-10-2006",
}