A Neural Network as a Quality Control Monitor of an Intelligent System

Ray R. Hashemi, J. Talburt, Meena Velusamy

Research output: Contribution to book or proceedingChapter

Original languageAmerican English
Title of host publicationProceedings of the 1995 International ACM Applied Computing Symposium (SAC'95)
StatePublished - Mar 1995

Keywords

  • Neural network
  • Quality control monitor
  • Intelligent system

DC Disciplines

  • Engineering
  • Computer Sciences

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