Charge trapping in irradiated SOI wafers measured by second harmonic generation
- Bongim Jun
- , Ronald D. Schrimpf
- , Daniel M. Fleetwood
- , Yelena V. White
- , Robert Pasternak
- , Sergey N. Rashkeev
- , Francois Brunier
- , Nicolas Bresson
- , Marion Fouillat
- , Sorin Cristoloveanu
- , Norman H. Tolk
- Vanderbilt University
- Soitec S.A.
- ENSERG
- Bordeaux 1 Mesures Physiques
Research output: Contribution to journal › Article › peer-review
23
Scopus
citations