Abstract
Methods are examined for obtaining probability limits for Phase I Shewhart X̄ charts when the process mean and standard deviation are estimated. The design methods assume m independent random samples of size n will be taken periodically from a normally distributed process. It is shown that the joint distribution of the standardized subgroup means follows either an approximate or exact multivariate t distribution, depending on the standard deviation estimator used. The multivariate t distribution is used to define the probability limits for the Phase I X̄ chart. Extensive simulation compares the performance of the proposed limits with other design procedures. Tables of design constants are given for m < 20, and simple procedures for obtaining design constants are given for m ≥ 20.
| Original language | English |
|---|---|
| Pages (from-to) | 497-510 |
| Number of pages | 14 |
| Journal | Quality and Reliability Engineering International |
| Volume | 20 |
| Issue number | 5 |
| DOIs | |
| State | Published - Aug 2004 |
Scopus Subject Areas
- Safety, Risk, Reliability and Quality
- Management Science and Operations Research
Keywords
- Control charts
- Retrospective
- Shewhart charts