IEEE Recommended Practice for Hardware-in-the-Loop (HIL) Simulation-Based Testing of Electric Power Apparatus and Controls

  • Georg Lauss
  • , Blake Lundstrom
  • , Charles Adewole
  • , Mohammad Meraj Alam
  • , John Amy
  • , Amjad Anvari-Moghaddam
  • , Beat Arnet
  • , Andrea Benigni
  • , Jordan Bell
  • , Jean Bélanger
  • , Ron Brandl
  • , Geraint Chaffey
  • , Ritwik Chowdhury
  • , Frederic Colas
  • , Masoud Davari
  • , Giovanni De Carne
  • , Angel de Castro
  • , Erik de Jong
  • , Ali Dehkordi
  • , Lalitha Devarakonda
  • Matthias DeterChristian Dufour, Ewane Etinge, Omar Faruque, Aaron Findley, Dale Finney, Normann Fischer, Giambattista Gruosso, Francois Guay, Efren Guillo-Sansano, Dinesh Gurusinghe, Krishnanjan Gubba, Nikos Hatziargyriou, Qiteng Hong, Babak Hosseini, Victor Huang, Ruben Inzunza, Christian Jegues, Kyle Jennett, Steven A. Johnston, Shahab Karrari, Mohammed Masum, Siraj Khan, Axel Kiffe, Christoph Klie, Panos Kotsampopoulos, Jeykishan Kumar, James Langston, Jesse Leonhard, Wei Li, Yuan Liao, Philippe Le-Huy, Rick Loenders, Deepak Maragal, Richard Meeker Jr., Sakis Meliopoulos, Ismael Mendoza, Fazel Mohammadi, Antonello Monti, Juan Montoya, Ramin Mirzahosseini, Dean Ouellette, Gernot Pammer, Mahendra Patel, Jean-Nicolas Paquin, Andrey Popov, Frank Puschmann, Athula Rajapakse, Matthew Reno, Nicole Rexwinkel, Bruce Rigby, Paul Roege, Marina Sanz, Christian Schegan, Karl Schoder, Deda Seliman, Ajinkya Sinkar, Srdjan Srdic, Mischa Steurer, Thomas Strasser, Kai Strunz, Olivier Trembley, Carlos Villegas, Jose Vivas, Donald Ware, James van de Ligt, Jaya Yellajosula, Amin Zamini

Research output: Book, anthology, or reportReportpeer-review

Abstract

Recommendations for the user to design, establish, and execute real-time based hardware-in-the-loop setups are provided in this document, along with analytical frameworks related to stability, accuracy, and sensitivity assessment, as well as experimental case studies. Additional informative material is provided in the annexes.
Original languageAmerican English
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages146
ISBN (Electronic)979-8-8557-2368-7
ISBN (Print)979-8-8557-2369-4
DOIs
StatePublished - Aug 29 2025

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