Abstract
An improved phase algorithm for phase-measuring profilometry (PMP) is presented. In comparison with the traditional algorithms, it can remove the influence of the carrier frequency before unwrapping and slow down the variation of the phase. This new algorithm makes the procedure of phase unwrapping easier and more automatic. It is especially suitable for PMP with a high-frequency grating.
Original language | English |
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Pages (from-to) | 1799-1805 |
Number of pages | 7 |
Journal | Optical Engineering |
Volume | 36 |
Issue number | 6 |
DOIs | |
State | Published - Jun 1997 |
Scopus Subject Areas
- Atomic and Molecular Physics, and Optics
- General Engineering
Keywords
- Phase measuring profilometry
- Phase unwrapping
- Three-dimensional sensing