Abstract
A count of the number of defects is often used to monitor the quality of a production process. When defects rarely occur in a process, it is often desirable to monitor the time between the occurrence of each defect rather than a count of the number of defects. An exponential distribution often provides a useful model of the time between defects. Phase I control charts for exponentially distributed processes are discussed. Methods for computing the control limits are given and the overall Type I error rates of these charts are evaluated.
Original language | American English |
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Journal | Quality and Reliability Engineering International |
Volume | 18 |
DOIs | |
State | Published - Nov 1 2002 |
Keywords
- Control Charts
- Phase I
DC Disciplines
- Education
- Mathematics