Quantification of Fluorine Density in the Outermost Atomic Layer

R. D. Van de Grampel, W. Ming, A. Gildenpfennig, J. Laven, H. H. Brongersma, G. De With, R. Van der Linde

Research output: Contribution to journalArticlepeer-review

31 Scopus citations

Abstract

The outermost atomic layer of perfluorinated thiol monolayers on gold and poly(tetrafluoroethylene) (PTFE) is analyzed by low-energy ion scattering. Absolute quantification of fluorine density in this layer was achieved after calibrating the fluorine signal with a freshly cleaved LiF(100) single crystal. The fluorine density of monolayers of a C3F17-thiol on gold was 1.48 × 1015 F atoms/cm2, whereas for PTFE a value of 1.24 × 1015 F atoms/cm2 was observed. This difference was explained by the different tilt angles of the thiol on gold and PTFE chains with respect to the surface normal. Both a configurational and a molecular interpretation on the perfluorinated thiol monolayer on gold are given.

Original languageEnglish
Pages (from-to)145-149
Number of pages5
JournalLangmuir
Volume20
Issue number1
DOIs
StatePublished - Jan 6 2004

Scopus Subject Areas

  • General Materials Science
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Spectroscopy
  • Electrochemistry

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