Quantification of Fluorine Density in the Outermost Atomic Layer

  • R. D. Van de Grampel
  • , W. Ming
  • , A. Gildenpfennig
  • , J. Laven
  • , H. H. Brongersma
  • , G. De With
  • , R. Van der Linde

Research output: Contribution to journalArticlepeer-review

31 Scopus citations

Abstract

The outermost atomic layer of perfluorinated thiol monolayers on gold and poly(tetrafluoroethylene) (PTFE) is analyzed by low-energy ion scattering. Absolute quantification of fluorine density in this layer was achieved after calibrating the fluorine signal with a freshly cleaved LiF(100) single crystal. The fluorine density of monolayers of a C3F17-thiol on gold was 1.48 × 1015 F atoms/cm2, whereas for PTFE a value of 1.24 × 1015 F atoms/cm2 was observed. This difference was explained by the different tilt angles of the thiol on gold and PTFE chains with respect to the surface normal. Both a configurational and a molecular interpretation on the perfluorinated thiol monolayer on gold are given.

Original languageEnglish
Pages (from-to)145-149
Number of pages5
JournalLangmuir
Volume20
Issue number1
DOIs
StatePublished - Jan 6 2004

Scopus Subject Areas

  • General Materials Science
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Spectroscopy
  • Electrochemistry

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