@conference{bf4eb09502a343988a20ebb0203f1963,
title = "Silane Stability on Silicon Surfaces as Measured by Variable-Angle Spectroscopic Ellipsometry, AFM, and Contact Angle Measurements",
keywords = "Silane stability, Silicon surfaces, Measured, Variable-angle, Spectroscopic ellipsometry, AFM, Contact angle measurements",
author = "Balderson, {S. D.} and Gajdosik-Nivens, {Delana A.} and Lacy, {W. B.} and Conrad, {D. W.}",
note = "Abstracts of papers, 216th ACS national meeting : Boston, MA, August 23 - 27, 1998 ; Pt. 2; 216th ACS National Meeting ; Conference date: 23-08-1998",
year = "1998",
month = aug,
day = "23",
language = "American English",
}