Surface studies of partially fluorinated polymethacrylates: A combined XPS and LEIS analysis

R. D. Van de Grampel, W. Ming, A. Gildenpfennig, W. J.H. Van Gennip, M. J. Krupers, J. Laven, J. W. Niemantsverdriet, H. H. Brongersma, R. R. Van der Linde

Research output: Contribution to journalConference articlepeer-review

24 Scopus citations

Abstract

Thin films of copolymers of 1,1-dihydroperfluoroheptyl methacrylate (FHMA) and methyl methacrylate (MMA) were investigated with respect to both their molecular and macroscopic surface properties. Introduction of FHMA entities in copolymer decreases the surface energy to a large extent. Angle resolved X-ray photoelectron spectroscopy (XPS) measurements show an increased average fluorine concentration in a surface layer thickness of a few nanometers, when compared to the fluorine concentration in the bulk. Static LEIS experiments, which selectively probe the outermost atomic layer, show an even stronger enrichment of fluorine atoms.

Original languageEnglish
Pages (from-to)273-279
Number of pages7
JournalProgress in Organic Coatings
Volume45
Issue number2-3
DOIs
StatePublished - Oct 2002
EventAthens 2000 - Athene, Greece
Duration: Jul 6 2001Jul 6 2001

Scopus Subject Areas

  • General Chemical Engineering
  • Surfaces, Coatings and Films
  • Organic Chemistry
  • Materials Chemistry

Keywords

  • Fluorinated polymethacrylates
  • LEIS
  • Stratification
  • Surface analysis
  • XPS

Fingerprint

Dive into the research topics of 'Surface studies of partially fluorinated polymethacrylates: A combined XPS and LEIS analysis'. Together they form a unique fingerprint.

Cite this